Algorithms for surface reconstruction from curvature data for freeform aspherics

Dae Wook Kim; Byoung Chang Kim; Chunyu Zhao; Chang Jin Oh; James H Burge

doi:10.1117/12.2024285

Algorithms for surface reconstruction from curvature data for freeform aspherics

Dae Wook Kim, Byoung Chang Kim, Chunyu Zhao, Chang Jin Oh, James H Burge

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

9 Scopus citations

Abstract

Increasing demand for highly accurate freeform aspheric surfaces requires accurate and efficient measurement techniques. One promising possibility uses a sub-aperture scanning system that measures local curvature variations across the part. In this paper, we develop and demonstrate two different data processing algorithms, a zonal approach using Southwell integration method and a modal approach leveraging Zernike curvature basis, that reconstruct the surface 3-dimensional profiles from the curvature data. The performance of suggested methods and the sensitivity to noise is diagnosed for various SNR (Signal-to-Noise Ratio) cases.

Original language	English (US)
Title of host publication	Optical Manufacturing and Testing X
DOIs	https://doi.org/10.1117/12.2024285
State	Published - 2013
Event	Optical Manufacturing and Testing X - San Diego, CA, United States Duration: Aug 26 2013 → Aug 27 2013

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	8838
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Other

Other	Optical Manufacturing and Testing X
Country/Territory	United States
City	San Diego, CA
Period	8/26/13 → 8/27/13

Keywords

Aspheric metrology
Curvature sensing
Freeform aspherics
Optical testing

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.2024285

Cite this

Kim, DW, Kim, BC, Zhao, C, Oh, CJ & Burge, JH 2013, Algorithms for surface reconstruction from curvature data for freeform aspherics. in Optical Manufacturing and Testing X., 88380B, Proceedings of SPIE - The International Society for Optical Engineering, vol. 8838, Optical Manufacturing and Testing X, San Diego, CA, United States, 8/26/13. https://doi.org/10.1117/12.2024285

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title = "Algorithms for surface reconstruction from curvature data for freeform aspherics",

abstract = "Increasing demand for highly accurate freeform aspheric surfaces requires accurate and efficient measurement techniques. One promising possibility uses a sub-aperture scanning system that measures local curvature variations across the part. In this paper, we develop and demonstrate two different data processing algorithms, a zonal approach using Southwell integration method and a modal approach leveraging Zernike curvature basis, that reconstruct the surface 3-dimensional profiles from the curvature data. The performance of suggested methods and the sensitivity to noise is diagnosed for various SNR (Signal-to-Noise Ratio) cases.",

keywords = "Aspheric metrology, Curvature sensing, Freeform aspherics, Optical testing",

author = "Kim, {Dae Wook} and Kim, {Byoung Chang} and Chunyu Zhao and Oh, {Chang Jin} and Burge, {James H}",

year = "2013",

doi = "10.1117/12.2024285",

language = "English (US)",

isbn = "9780819496881",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

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AU - Kim, Dae Wook

AU - Kim, Byoung Chang

AU - Zhao, Chunyu

AU - Oh, Chang Jin

AU - Burge, James H

PY - 2013

Y1 - 2013

N2 - Increasing demand for highly accurate freeform aspheric surfaces requires accurate and efficient measurement techniques. One promising possibility uses a sub-aperture scanning system that measures local curvature variations across the part. In this paper, we develop and demonstrate two different data processing algorithms, a zonal approach using Southwell integration method and a modal approach leveraging Zernike curvature basis, that reconstruct the surface 3-dimensional profiles from the curvature data. The performance of suggested methods and the sensitivity to noise is diagnosed for various SNR (Signal-to-Noise Ratio) cases.

AB - Increasing demand for highly accurate freeform aspheric surfaces requires accurate and efficient measurement techniques. One promising possibility uses a sub-aperture scanning system that measures local curvature variations across the part. In this paper, we develop and demonstrate two different data processing algorithms, a zonal approach using Southwell integration method and a modal approach leveraging Zernike curvature basis, that reconstruct the surface 3-dimensional profiles from the curvature data. The performance of suggested methods and the sensitivity to noise is diagnosed for various SNR (Signal-to-Noise Ratio) cases.

KW - Aspheric metrology

KW - Curvature sensing

KW - Freeform aspherics

KW - Optical testing

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DO - 10.1117/12.2024285

M3 - Conference contribution

AN - SCOPUS:84888195821

SN - 9780819496881

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Optical Manufacturing and Testing X

T2 - Optical Manufacturing and Testing X

Y2 - 26 August 2013 through 27 August 2013

ER -

Algorithms for surface reconstruction from curvature data for freeform aspherics

Abstract

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