Algorithms for surface reconstruction from curvature data for freeform aspherics

Dae Wook Kim, Byoung Chang Kim, Chunyu Zhao, Chang Jin Oh, James H. Burge

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations


Increasing demand for highly accurate freeform aspheric surfaces requires accurate and efficient measurement techniques. One promising possibility uses a sub-aperture scanning system that measures local curvature variations across the part. In this paper, we develop and demonstrate two different data processing algorithms, a zonal approach using Southwell integration method and a modal approach leveraging Zernike curvature basis, that reconstruct the surface 3-dimensional profiles from the curvature data. The performance of suggested methods and the sensitivity to noise is diagnosed for various SNR (Signal-to-Noise Ratio) cases.

Original languageEnglish (US)
Title of host publicationOptical Manufacturing and Testing X
StatePublished - 2013
EventOptical Manufacturing and Testing X - San Diego, CA, United States
Duration: Aug 26 2013Aug 27 2013

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


OtherOptical Manufacturing and Testing X
Country/TerritoryUnited States
CitySan Diego, CA


  • Aspheric metrology
  • Curvature sensing
  • Freeform aspherics
  • Optical testing

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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