Abstract
Three new polarimeters are described which represent advances in polarization metrology capabilities. Two are at a new polarization laboratory started at the University of Arizona's Optical Sciences Center, (1) a Fiber Optic Spectropolarimeter and (2) a High Speed Mueller Matrix Imaging Polarimeter. The third is a new visible Mueller Matrix Spectropolarimeter for optical component test from a startup company, Axometrics, which is useful for detailed characterization of optical components and thin films via spectra of diattenuation, retardance, and depolarization.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 43-50 |
| Number of pages | 8 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 5174 |
| DOIs | |
| State | Published - 2003 |
| Event | Novel Optical Systems Design and Optimization VI - San Diego, CA, United States Duration: Aug 4 2003 → Aug 4 2003 |
Keywords
- Depolarization
- Diattenuation
- Metrology
- Mueller matrices
- Polarimetry
- Polarization dependent loss
- Polarizers
- Retardance
- Retarders
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering