Advances in modeling polarimeter performance

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Artifacts in polarimeters are apparent polarization features which are not real but result from the systematic errors in the polarimeter. The polarization artifacts are different between division of focal plane, spectral, and time modulation polarimeters. Artifacts result from many sources such as source properties, micropolarizer arrays, coatings issues, vibrations, and stress birefringence. A modeling examples of polarization artifacts due to a micro-polarizer array polarimeter is presented.

Original languageEnglish (US)
Title of host publicationPolarization Science and Remote Sensing VIII
EditorsJoseph A. Shaw, Frans Snik
ISBN (Electronic)9781510612716
StatePublished - 2017
EventPolarization Science and Remote Sensing VIII 2017 - San Diego, United States
Duration: Aug 8 2017Aug 9 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


OtherPolarization Science and Remote Sensing VIII 2017
Country/TerritoryUnited States
CitySan Diego


  • Coronagraph
  • Imaging
  • Polarization
  • Polarization aberration
  • Polarization ray tracing

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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