Advanced surface metrology for meter-class optics

M. Valente, B. Lewis, N. Melena, M. Smith, J. H. Burge, C. Zhao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

Fingerprint

Dive into the research topics of 'Advanced surface metrology for meter-class optics'. Together they form a unique fingerprint.

Mathematics

Physics & Astronomy

Engineering & Materials Science

Chemical Compounds