Adjacent detector cross talk in CMOS smart detector arrays

Jerry D. Hayes, Mark A. Neifeld, Satish K. Sridharan, Richard W. Ziolkowski

Research output: Contribution to journalConference articlepeer-review

Abstract

Substrate and waveguide cross talk models are presented for CMOS smart detectors arrays. A test chip of linear arrays using both p+n and np detectors has been designed and fabricated for characterization of substrate and waveguide cross talk. It is shown that both the substrate and waveguide models agree well with the measured cross talk. Techniques for reducing cross talk in CMOS detector arrays are also presented.

Original languageEnglish (US)
Pages (from-to)102-107
Number of pages6
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume2291
DOIs
StatePublished - Oct 21 1994
EventIntegrated Optics and Microstructures II 1994 - San Diego, United States
Duration: Jul 24 1994Jul 29 1994

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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