Adaptive SPECT imaging with crossed-slit apertures

Heather L. Durko, Lars R. Furenlid

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Preclinical single-photon emission computed tomography (SPECT) is an essential tool for studying the progression, response to treatment, and physiological changes in small animal models of human disease. The wide range of imaging applications is often limited by the static design of many preclinical SPECT systems. We have developed a prototype imaging system that replaces the standard static pinhole aperture with two sets of movable, keel-edged copper-tungsten blades configured as crossed (skewed) slits. These apertures can be positioned independently between the object and detector, producing a continuum of imaging configurations in which the axial and transaxial magnifications are not constrained to be equal. We incorporated a megapixel silicon double-sided strip detector to permit ultrahigh-resolution imaging. We describe the configuration of the adjustable slit aperture imaging system and discuss its application toward adaptive imaging, and reconstruction techniques using an accurate imaging forward model, a novel geometric calibration technique, and a GPU-based ultra-high-resolution reconstruction code.

Original languageEnglish (US)
Title of host publicationMedical Applications of Radiation Detectors IV
EditorsHans N. Roehrig, Lars R. Furenlid, H. Bradford Barber
PublisherSPIE
ISBN (Electronic)9781628412413
DOIs
StatePublished - 2014
EventMedical Applications of Radiation Detectors IV - San Diego, United States
Duration: Aug 18 2014Aug 21 2014

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9214
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherMedical Applications of Radiation Detectors IV
Country/TerritoryUnited States
CitySan Diego
Period8/18/148/21/14

Keywords

  • Adaptive
  • Adjustable
  • Crossed slit
  • Double-sided strip detector
  • SPECT
  • Silicon

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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