@inproceedings{f5225752501840dfa6ba3265b705a15d,
title = "Accurate measurement of refractive indices of optical wafers by using fabry-perot type interference",
abstract = "We investigated Fabry-Perot type interference from optical wafers to measure the refractive indices. This method is accurate (~10-5 for fused silica), insensitive to environmental perturbation, and simple to implement, compared to the conventional indexmeasurement methods.",
author = "Choi, {Hee Joo} and Lim, {Hwan Hong} and Bae, {In Ho} and Moon, {Han Seb} and Myoungsik Cha and Eom, {Tae Bong} and Ju, {Jung Jin}",
year = "2009",
doi = "10.1364/fio.2009.jwc11",
language = "English (US)",
isbn = "9781557528780",
series = "Optics InfoBase Conference Papers",
publisher = "Optical Society of America (OSA)",
booktitle = "Frontiers in Optics, FiO 2009",
note = "Frontiers in Optics, FiO 2009 ; Conference date: 11-10-2009 Through 15-10-2009",
}