@inproceedings{24bab7356ef943e087a6b597d9717471,
title = "Absolute surface metrology of X-ray telescope mirrors through axial shift mapping",
abstract = "The next generation of X-ray telescopes will require mirror segments to be characterized to a surface uncertainty of 5 nm RMS or better. We present axial shift mapping, a Fizeau interferometry method to characterized near-cylindrical null correctors and surfaces. We extend our previously tested technique to cylindrical optics of similar dimensions to X-ray telescope mirrors. We report on progress towards full surface extraction of a cylindrical optic using axial shift mapping.",
keywords = "X-ray mirror metrology, X-ray telescope, absolute metrology, computer generated hologram, interferometric metrology methods, optical metrology",
author = "Wisniewski, {Hayden J.} and Heilmann, {Ralf K.} and Schattenburg, {Mark L.} and Chalifoux, {Brandon D.}",
note = "Publisher Copyright: {\textcopyright} 2023 SPIE.; Optics for EUV, X-Ray, and Gamma-Ray Astronomy XI 2023 ; Conference date: 22-08-2023 Through 24-08-2023",
year = "2023",
doi = "10.1117/12.2677596",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "O'Dell, {Stephen L.} and Gaskin, {Jessica A.} and Giovanni Pareschi and Daniele Spiga",
booktitle = "Optics for EUV, X-Ray, and Gamma-Ray Astronomy XI",
}