Absolute surface metrology of X-ray telescope mirrors through axial shift mapping

Hayden J. Wisniewski, Ralf K. Heilmann, Mark L. Schattenburg, Brandon D. Chalifoux

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The next generation of X-ray telescopes will require mirror segments to be characterized to a surface uncertainty of 5 nm RMS or better. We present axial shift mapping, a Fizeau interferometry method to characterized near-cylindrical null correctors and surfaces. We extend our previously tested technique to cylindrical optics of similar dimensions to X-ray telescope mirrors. We report on progress towards full surface extraction of a cylindrical optic using axial shift mapping.

Original languageEnglish (US)
Title of host publicationOptics for EUV, X-Ray, and Gamma-Ray Astronomy XI
EditorsStephen L. O'Dell, Jessica A. Gaskin, Giovanni Pareschi, Daniele Spiga
PublisherSPIE
ISBN (Electronic)9781510665729
DOIs
StatePublished - 2023
EventOptics for EUV, X-Ray, and Gamma-Ray Astronomy XI 2023 - San Diego, United States
Duration: Aug 22 2023Aug 24 2023

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12679
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptics for EUV, X-Ray, and Gamma-Ray Astronomy XI 2023
Country/TerritoryUnited States
CitySan Diego
Period8/22/238/24/23

Keywords

  • absolute metrology
  • computer generated hologram
  • interferometric metrology methods
  • optical metrology
  • X-ray mirror metrology
  • X-ray telescope

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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