Absence of final-state screening shifts in photoemission spectroscopy frontier orbital alignment measurements at organic/semiconductor interfaces

R. Schlaf; B. A. Parkinson; P. A. Lee; K. W. Nebesny; N. R. Armstrong

doi:10.1016/S0039-6028(98)00850-4

Absence of final-state screening shifts in photoemission spectroscopy frontier orbital alignment measurements at organic/semiconductor interfaces

R. Schlaf, B. A. Parkinson, P. A. Lee, K. W. Nebesny, N. R. Armstrong

Chemistry and Biochemistry

Research output: Contribution to journal › Article › peer-review

30 Scopus citations

Abstract

Chloroindium phthalocyanine (ClInPc) thin films were grown by vapor deposition on highly oriented pyrolytic graphite (HOPG) substrates. The alignment of the highest occupied and lowest unoccupied molecular orbitals (HOMO, LUMO) of the phthalocyanine layer relative to the Fermi level of the HOPG substrate was determined by combined X-ray and ultraviolet photoemission spectroscopy (XPS, UPS) measurements. The measurements revealed that the electronic structure of this interface is almost free of band bending, which results in only very weak shifts of the ClInPc-related XPS core-level peaks. Therefore, the influence of final-state screening shifts on orbital alignment measurements at organic/semiconductor interfaces with photoemission spectroscopy (PES) can be investigated in this system. The comparison of our results with PES measurements of monolayers and multilayers of xenon on palladium substrates revealed that final-state screening plays no or only an insignificant role within the accuracy that can be achieved in such measurements.

Original language	English (US)
Pages (from-to)	L122-L129
Journal	Surface Science
Volume	420
Issue number	1
DOIs	https://doi.org/10.1016/S0039-6028(98)00850-4
State	Published - Jan 11 1999

Keywords

Growth/photoelectron emission/surface electronic phenomena
Metal-semiconductor interfaces
Metal-semiconductor nonmagnetic heterostructures
Semiconducting films
Surfaces and/or films
Visible and ultraviolet photoelectron spectroscopy

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/S0039-6028(98)00850-4

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title = "Absence of final-state screening shifts in photoemission spectroscopy frontier orbital alignment measurements at organic/semiconductor interfaces",

abstract = "Chloroindium phthalocyanine (ClInPc) thin films were grown by vapor deposition on highly oriented pyrolytic graphite (HOPG) substrates. The alignment of the highest occupied and lowest unoccupied molecular orbitals (HOMO, LUMO) of the phthalocyanine layer relative to the Fermi level of the HOPG substrate was determined by combined X-ray and ultraviolet photoemission spectroscopy (XPS, UPS) measurements. The measurements revealed that the electronic structure of this interface is almost free of band bending, which results in only very weak shifts of the ClInPc-related XPS core-level peaks. Therefore, the influence of final-state screening shifts on orbital alignment measurements at organic/semiconductor interfaces with photoemission spectroscopy (PES) can be investigated in this system. The comparison of our results with PES measurements of monolayers and multilayers of xenon on palladium substrates revealed that final-state screening plays no or only an insignificant role within the accuracy that can be achieved in such measurements.",

keywords = "Growth/photoelectron emission/surface electronic phenomena, Metal-semiconductor interfaces, Metal-semiconductor nonmagnetic heterostructures, Semiconducting films, Surfaces and/or films, Visible and ultraviolet photoelectron spectroscopy",

author = "R. Schlaf and Parkinson, {B. A.} and Lee, {P. A.} and Nebesny, {K. W.} and Armstrong, {N. R.}",

note = "Funding Information: We would like to thank R.H. Young for helpful discussions. We gratefully acknowledge support for this research by The Office of Naval Research/DOD/MURI Center for Advanced Multi Functional Polymers and Molecular Assemblies (CAMP), the National Science Foundation (Chemistry) and by the Materials Characterization Program–State of Arizona. R.S. acknowledges support by a {\textquoteleft}Forschungsstipendium{\textquoteright} fellowship granted by the Deutsche Forschungsgemeinschaft (DFG).",

year = "1999",

month = jan,

day = "11",

doi = "10.1016/S0039-6028(98)00850-4",

language = "English (US)",

volume = "420",

pages = "L122--L129",

journal = "Surface Science",

issn = "0039-6028",

publisher = "Elsevier B.V.",

number = "1",

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TY - JOUR

T1 - Absence of final-state screening shifts in photoemission spectroscopy frontier orbital alignment measurements at organic/semiconductor interfaces

AU - Schlaf, R.

AU - Parkinson, B. A.

AU - Lee, P. A.

AU - Nebesny, K. W.

AU - Armstrong, N. R.

N1 - Funding Information: We would like to thank R.H. Young for helpful discussions. We gratefully acknowledge support for this research by The Office of Naval Research/DOD/MURI Center for Advanced Multi Functional Polymers and Molecular Assemblies (CAMP), the National Science Foundation (Chemistry) and by the Materials Characterization Program–State of Arizona. R.S. acknowledges support by a ‘Forschungsstipendium’ fellowship granted by the Deutsche Forschungsgemeinschaft (DFG).

PY - 1999/1/11

Y1 - 1999/1/11

N2 - Chloroindium phthalocyanine (ClInPc) thin films were grown by vapor deposition on highly oriented pyrolytic graphite (HOPG) substrates. The alignment of the highest occupied and lowest unoccupied molecular orbitals (HOMO, LUMO) of the phthalocyanine layer relative to the Fermi level of the HOPG substrate was determined by combined X-ray and ultraviolet photoemission spectroscopy (XPS, UPS) measurements. The measurements revealed that the electronic structure of this interface is almost free of band bending, which results in only very weak shifts of the ClInPc-related XPS core-level peaks. Therefore, the influence of final-state screening shifts on orbital alignment measurements at organic/semiconductor interfaces with photoemission spectroscopy (PES) can be investigated in this system. The comparison of our results with PES measurements of monolayers and multilayers of xenon on palladium substrates revealed that final-state screening plays no or only an insignificant role within the accuracy that can be achieved in such measurements.

AB - Chloroindium phthalocyanine (ClInPc) thin films were grown by vapor deposition on highly oriented pyrolytic graphite (HOPG) substrates. The alignment of the highest occupied and lowest unoccupied molecular orbitals (HOMO, LUMO) of the phthalocyanine layer relative to the Fermi level of the HOPG substrate was determined by combined X-ray and ultraviolet photoemission spectroscopy (XPS, UPS) measurements. The measurements revealed that the electronic structure of this interface is almost free of band bending, which results in only very weak shifts of the ClInPc-related XPS core-level peaks. Therefore, the influence of final-state screening shifts on orbital alignment measurements at organic/semiconductor interfaces with photoemission spectroscopy (PES) can be investigated in this system. The comparison of our results with PES measurements of monolayers and multilayers of xenon on palladium substrates revealed that final-state screening plays no or only an insignificant role within the accuracy that can be achieved in such measurements.

KW - Growth/photoelectron emission/surface electronic phenomena

KW - Metal-semiconductor interfaces

KW - Metal-semiconductor nonmagnetic heterostructures

KW - Semiconducting films

KW - Surfaces and/or films

KW - Visible and ultraviolet photoelectron spectroscopy

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VL - 420

SP - L122-L129

JO - Surface Science

JF - Surface Science

IS - 1

ER -

Absence of final-state screening shifts in photoemission spectroscopy frontier orbital alignment measurements at organic/semiconductor interfaces

Abstract

Keywords

ASJC Scopus subject areas

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