TY - GEN
T1 - A robust finite-point based gate model considering process variations
AU - Mitev, Alex
AU - Ganesan, Dinesh
AU - Shanmugasundaram, Dheepan
AU - Cao, Yu
AU - Wang, Janet M.
PY - 2007
Y1 - 2007
N2 - This paper proposes a robust gate model based on a finite-point modeling scheme. With current source model (CSM) framework, a robust, finite-point gate model is constructed. The new model depends on the selective points of I-V curves of gates. Thus, it implicitly incorporates the variation related parameters into finite points. In addition, to provide good accuracy on output waveform, the new model creates the input and output capacitance elements as nonlinear dependency on input/output waveform and process variation parameters. Experimental results show that the generated gate model has less than 3.7% error at mean, less than 6.2% error at variance and less than 5.8% at 90% percentile for cumulative density functions (CDFs).
AB - This paper proposes a robust gate model based on a finite-point modeling scheme. With current source model (CSM) framework, a robust, finite-point gate model is constructed. The new model depends on the selective points of I-V curves of gates. Thus, it implicitly incorporates the variation related parameters into finite points. In addition, to provide good accuracy on output waveform, the new model creates the input and output capacitance elements as nonlinear dependency on input/output waveform and process variation parameters. Experimental results show that the generated gate model has less than 3.7% error at mean, less than 6.2% error at variance and less than 5.8% at 90% percentile for cumulative density functions (CDFs).
UR - http://www.scopus.com/inward/record.url?scp=49749089291&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=49749089291&partnerID=8YFLogxK
U2 - 10.1109/ICCAD.2007.4397346
DO - 10.1109/ICCAD.2007.4397346
M3 - Conference contribution
AN - SCOPUS:49749089291
SN - 1424413826
SN - 9781424413829
T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
SP - 692
EP - 697
BT - 2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
T2 - 2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
Y2 - 4 November 2007 through 8 November 2007
ER -