A probabilistic analysis of pipelined global interconnect under process variations

Navneeth Kankani, Vineet Agarwal, Janet Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

The main thesis of this paper is to perform a reliability based performance analysis for a shared latch inserted global interconnect under uncertainty. We first put forward a novel delay metric named DMA for estimation of interconnect delay probability density function considering process variations. Without considerable loss in accuracy, DMA can achieve high computational efficiency even in a large space of random variables. We then propose a comprehensive probabilistic methodology for sampling transfers, on a shared latch inserted global interconnect, that highly improves the reliability of the interconnect. Improvements up to 125% are observed in the reliability when compared to deterministic sampling approach. It is also shown that dual phase clocking scheme for pipelined global interconnect is able to meet more stringent timing constraints due to its lower latency.

Original languageEnglish (US)
Title of host publicationProceedings of the ASP-DAC 2006
Subtitle of host publicationAsia and South Pacific Design Automation Conference 2006
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages724-729
Number of pages6
ISBN (Print)0780394518, 9780780394513
DOIs
StatePublished - 2006
EventASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006 - Yokohama, Japan
Duration: Jan 24 2006Jan 27 2006

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Volume2006

Other

OtherASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006
Country/TerritoryJapan
CityYokohama
Period1/24/061/27/06

ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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