A novel method for measuring the vertical birefringence of optical disk substrates

M. Mansuripur; Yung Chieh Hsieh

doi:10.1364/AO.33.008112

A novel method for measuring the vertical birefringence of optical disk substrates

Research output: Contribution to journal › Article › peer-review

Abstract

We describe a simple method of measuring vertical birefringence over the entire surface of an optical disk substrate. Our design consists of a linearly polarized He-Ne laser (1-2 mW) and a CCD camera interfaced to a computer. The measurement is non-intrusive, easy to set up, and needs only a few seconds to collect the data and plot a map of vertical birefringence over the surface area of the disk. The system described here is potentially useful as a quality control tool in substrate manufacturing environments.

Original language	English (US)
Pages (from-to)	8112-8114
Number of pages	3
Journal	Applied optics
Volume	33
Issue number	34
DOIs	https://doi.org/10.1364/AO.33.008112
State	Published - Dec 1994

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering

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abstract = "We describe a simple method of measuring vertical birefringence over the entire surface of an optical disk substrate. Our design consists of a linearly polarized He-Ne laser (1-2 mW) and a CCD camera interfaced to a computer. The measurement is non-intrusive, easy to set up, and needs only a few seconds to collect the data and plot a map of vertical birefringence over the surface area of the disk. The system described here is potentially useful as a quality control tool in substrate manufacturing environments.",

author = "M. Mansuripur and Hsieh, {Yung Chieh}",

year = "1994",

month = dec,

doi = "10.1364/AO.33.008112",

language = "English (US)",

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journal = "Applied optics",

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publisher = "The Optical Society",

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AB - We describe a simple method of measuring vertical birefringence over the entire surface of an optical disk substrate. Our design consists of a linearly polarized He-Ne laser (1-2 mW) and a CCD camera interfaced to a computer. The measurement is non-intrusive, easy to set up, and needs only a few seconds to collect the data and plot a map of vertical birefringence over the surface area of the disk. The system described here is potentially useful as a quality control tool in substrate manufacturing environments.

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A novel method for measuring the vertical birefringence of optical disk substrates

Abstract

ASJC Scopus subject areas

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