TY - GEN
T1 - A Nonparametric degradation-based method for modeling reliability growth
AU - Ruiz, Cesar
AU - Liao, Haitao
AU - Pohl, Ed
N1 - Funding Information:
This research was supported in part by the Office of the Secretary of Defense, Directorate of Operational Test and Evaluation (OSD DOT&E) and the Test Resource Management Center (TRMC) under the Science of Test research program.
Publisher Copyright:
© 2019 IEEE.
PY - 2019/1
Y1 - 2019/1
N2 - The competitiveness of the modern business environment creates a need for shortening the development time while assuring high product reliability. In addition, recent technological advancements in sensor technology and data acquisition have made it possible to continuously monitor the health status or performance of a product during testing. Using such condition monitoring data, the designer can model the degradation process of this product and provides an informative and accurate tool for failure analysis and reliability estimation. Recently, much attention has been focused on developing new reliability growth methods in hopes of speeding up product development in a cost-effective way. To this end, accelerated testing can be conducted in a reliability growth program. One way to take advantage of both accelerated testing and degradation analysis for reliability growth is to conduct accelerated degradation testing (ADT).
AB - The competitiveness of the modern business environment creates a need for shortening the development time while assuring high product reliability. In addition, recent technological advancements in sensor technology and data acquisition have made it possible to continuously monitor the health status or performance of a product during testing. Using such condition monitoring data, the designer can model the degradation process of this product and provides an informative and accurate tool for failure analysis and reliability estimation. Recently, much attention has been focused on developing new reliability growth methods in hopes of speeding up product development in a cost-effective way. To this end, accelerated testing can be conducted in a reliability growth program. One way to take advantage of both accelerated testing and degradation analysis for reliability growth is to conduct accelerated degradation testing (ADT).
KW - Accelerated Degradation Testing
KW - Gaussian Process
KW - Reliability Growth
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U2 - 10.1109/RAMS.2019.8769026
DO - 10.1109/RAMS.2019.8769026
M3 - Conference contribution
AN - SCOPUS:85069960729
T3 - Proceedings - Annual Reliability and Maintainability Symposium
BT - RAMS 2019 - 2019 Annual Reliability and Maintainability Symposium, Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 Annual Reliability and Maintainability Symposium, RAMS 2019
Y2 - 28 January 2019 through 31 January 2019
ER -