A new test stand for dynamically testing coupon samples

Yan Zhang, Tom D. Muster, John Butz, Warren Bletcher

Research output: Contribution to journalConference articlepeer-review


A new dynamic test stand is built to test coupon samples for volumetric bit wise optical data storage applications. An unconventional rotating head and fixed sample design is employed. Results from media samples are reported that illustrate pulse-length/power optimization and focus sensitivity. One sample is shown to be appropriate for volumetric applications based in its focus sensitivity.

Original languageEnglish (US)
Pages (from-to)357-360
Number of pages4
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - 2003
EventOptical Data Storage 2003 - Vancouver, BC, Canada
Duration: May 11 2003May 14 2003


  • Dynamic test stand
  • Volumetric optical data storage

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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