A new surface measuring technique using phase retrieval by amplitude interferometry

Bobby L. Ulich; Christopher K. Walker; Constance E. Philips-Walker; Warren B. Davison; John H. Davis; Charles E. Mayer

doi:10.1117/12.976192

A new surface measuring technique using phase retrieval by amplitude interferometry

Bobby L. Ulich
, Christopher K. Walker
, Constance E. Philips-Walker
, Warren B. Davison
, John H. Davis
, Charles E. Mayer

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

A new surface measuring instrument has been developed which is capable of measuring surface errors to the submicron level. RMS noise in measuring the surface error was found to decrease as [integration time]-1/2. The instrument can measure surface errors to within 10 microns in a small test region in only a few seconds of integration. The instrument could therefore be used to align radio telescope panels to high precision in real time.

Original language	English (US)
Pages (from-to)	55-62
Number of pages	8
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	608
DOIs	https://doi.org/10.1117/12.976192
State	Published - May 12 1986

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Instrumentation
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.976192

Cite this

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abstract = "A new surface measuring instrument has been developed which is capable of measuring surface errors to the submicron level. RMS noise in measuring the surface error was found to decrease as [integration time]-1/2. The instrument can measure surface errors to within 10 microns in a small test region in only a few seconds of integration. The instrument could therefore be used to align radio telescope panels to high precision in real time.",

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AU - Davis, John H.

AU - Mayer, Charles E.

PY - 1986/5/12

Y1 - 1986/5/12

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AB - A new surface measuring instrument has been developed which is capable of measuring surface errors to the submicron level. RMS noise in measuring the surface error was found to decrease as [integration time]-1/2. The instrument can measure surface errors to within 10 microns in a small test region in only a few seconds of integration. The instrument could therefore be used to align radio telescope panels to high precision in real time.

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JO - Proceedings of SPIE - The International Society for Optical Engineering

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A new surface measuring technique using phase retrieval by amplitude interferometry

Abstract

ASJC Scopus subject areas

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