Abstract
A new surface measuring instrument has been developed which is capable of measuring surface errors to the submicron level. RMS noise in measuring the surface error was found to decrease as [integration time]-1/2. The instrument can measure surface errors to within 10 microns in a small test region in only a few seconds of integration. The instrument could therefore be used to align radio telescope panels to high precision in real time.
Original language | English (US) |
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Pages (from-to) | 55-62 |
Number of pages | 8 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 608 |
DOIs | |
State | Published - May 12 1986 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering