A new surface measuring technique using phase retrieval by amplitude interferometry

Bobby L. Ulich, Christopher K. Walker, Constance E. Philips-Walker, Warren B. Davison, John H. Davis, Charles E. Mayer

Research output: Contribution to journalArticlepeer-review

1 Scopus citations


A new surface measuring instrument has been developed which is capable of measuring surface errors to the submicron level. RMS noise in measuring the surface error was found to decrease as [integration time]-1/2. The instrument can measure surface errors to within 10 microns in a small test region in only a few seconds of integration. The instrument could therefore be used to align radio telescope panels to high precision in real time.

Original languageEnglish (US)
Pages (from-to)55-62
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - May 12 1986

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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