A new stochastic model for systems under general repairs

Huairui R. Guo, Haitao Liao, Wenbiao Zhao, Adamantios Mettas

Research output: Contribution to journalArticlepeer-review

57 Scopus citations


Numerous stochastic models for repairable systems have been developed by assuming different time trends, and repair effects. In this paper, a new general repair model based on the repair history is presented. Unlike the existing models, the closed-form solutions of the reliability metrics can be derived analytically by solving a set of differential equations. Consequently, the confidence bounds of these metrics can be easily estimated. The proposed model, as well as the estimation approach, overcomes the drawbacks of the existing models. The practical use of the proposed model is demonstrated by a much-discussed set of data. Compared to the existing models, the new model is convenient, and provides accurate estimation results.

Original languageEnglish (US)
Pages (from-to)40-49
Number of pages10
JournalIEEE Transactions on Reliability
Issue number1
StatePublished - Mar 2007


  • Closed-form solution
  • Confidence bounds
  • General repair
  • Maximum likelihood estimation
  • Proportional failure intensity
  • Repairable system
  • Virtual age

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering


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