A multiphysics model that can capture crack patterns in Si thin films based on their microstructure

Julien Réthoré, Hao Zheng, Hong Li, Junjie Li, Katerina E. Aifantis

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Fingerprint

Dive into the research topics of 'A multiphysics model that can capture crack patterns in Si thin films based on their microstructure'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy

Chemical Compounds