A metrological characterization of the SPEED test-bed PIAACMC components

K. Barjot, P. Martinez, M. Beaulieu, C. Gouvret, A. Marcotto, O. Guyon, M. Belhadi, A. Caillat, T. Behaghel, J. M. Le Duigou, K. Dohlen, A. Vigan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations


The segmented pupil experiment for exoplanet detection (SPEED) facility aims to improve knowledge and insight into various areas required for gearing up high-contrast imaging instruments adapted to the unprecedented high angular resolution and complexity of the forthcoming extremely large telescopes (ELTs). SPEED combines an ELT simulator, cophasing optics, wavefront control and shaping with a multi-deformable mirror (DM) system, and optimized small inner-working angle (IWA) coronagraphy. The fundamental objective of the SPEED setup is to demonstrate deep contrast into a dark hole optimized for small field of view and very small IWA, adapted to the hunt of exoplanets in the habitable zone around late-Type stars. SPEED is designed to implement an optimized small IWA coronagraph: The phase-induced amplitude apodization complex mask coronagraph (PIAACMC). The PIAACMC consists in a multi-zone phase-shifting focal plane mask (FPM) and two apodization mirrors (PIAA-M1 and PIAA-M2), with strong manufacturing specifications. Recently, a first-generation prototype of a PIAACMC optimized for the SPEED facility has been designed and manufactured. The manufacturing components exhibit high optical quality that meets specifications. In this paper, we present how these components have been characterized by a metrological instrument, an interferential microscope, and then we show what is yielded from this characterization for the FPM and the mirrors. Eventually, we discuss the results and the perspectives of the implementation of the PIAACMC components on the SPEED setup.

Original languageEnglish (US)
Title of host publicationAdvances in Optical and Mechanical Technologies for Telescopes and Instrumentation IV
EditorsRamon Navarro, Roland Geyl
ISBN (Electronic)9781510636897
StatePublished - 2020
EventAdvances in Optical and Mechanical Technologies for Telescopes and Instrumentation IV 2020 - Virtual, Online, United States
Duration: Dec 14 2020Dec 22 2020

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceAdvances in Optical and Mechanical Technologies for Telescopes and Instrumentation IV 2020
Country/TerritoryUnited States
CityVirtual, Online


  • Exoplanets
  • apodization mirrors
  • complex focal plane mask
  • coronagraphy
  • interferential microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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