A high-pressure Raman spectroscopic study of hafnon, HfSiO4

Bouchaib Manoun, Robert T. Downs, Surendra K. Saxena

Research output: Contribution to journalArticlepeer-review

38 Scopus citations

Abstract

Raman spectra of synthetic HfSiO4 were determined to pressures of 38.2 GPa. Changes in the spectra indicate that HfSiO4 undergoes a room-temperature phase transition from the hafnon structure (I41/amd space group) to the scheelite structure (I41/a space group) at a pressure of ∼19.6 GPa. Upon release of pressure to ambient conditions, the spectra indicate that the sample retains the scheelite structure. Zircon has been classified previously as the least compressible tetrahedrally coordinated silicate known. However, pressure derivatives of the peak positions in hafnon are smaller than those in zircon, and suggest that hafnon is more incompressible than zircon. Furthermore, the pressure derivatives also suggest that the high-pressure, scheelite-structured HfSiO4 phase is more incompressible than the scheelite-structured ZrSiO4 (reidite). Thus, the post-hafnon phase appears to be even more incompressible than hafnon, which would make it the least compressible tetrahedrally coordinated silicate known to date.

Original languageEnglish (US)
Pages (from-to)1888-1892
Number of pages5
JournalAmerican Mineralogist
Volume91
Issue number11-12
DOIs
StatePublished - 2006

Keywords

  • Hafnon
  • Phase transformation
  • Raman spectroscopy
  • Scheelite-structured HfSiO

ASJC Scopus subject areas

  • Geophysics
  • Geochemistry and Petrology

Fingerprint

Dive into the research topics of 'A high-pressure Raman spectroscopic study of hafnon, HfSiO4'. Together they form a unique fingerprint.

Cite this