A comparison of reflected and emitted radiometric signal levels in SWIR, eSWIR, MWIR, and superband (SWIR through MWIR) optical systems

Luke Somerville, Patrick Leslie, Shane Jordan, Kyle Renshaw, Ron Driggers

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

With the improvement of infrared detector technology over the last several decades, traditional design trades regarding the use of different wavebands in optical systems are becoming less and less applicable. New detector technology is allowing for extended and even bridged wavebands, where previous detectors were limited to only a single waveband. These bridged waveband cameras, or superband cameras, contain detectors with response over large spectral spans, allowing them to take advantage of the unique properties of multiple wavebands. This type of system is especially of interest when the superband contains both the short-wave infrared (SWIR) waveband – where most of the signal comes from reflected light – and mid-wave infrared (MWIR) waveband – where most of the signal comes from emitted light. Such a superband system allows the combination of reflected and emitted light on a single detector, opening new system level optical design trades across many fields and disciplines. Presented is a comparison of reflected and emitted radiometric signal levels for four filtered wavebands using a 1.5 μm to 5.4 μm superband imaging system: (1) with a 1.9 μm SWIR shortpass filter, (2) with a 2 μm to 2.5 μm extended SWIR (eSWIR) bandpass filter, (3) with a 3 μm MWIR longpass filter, and (4) with no filter (i.e., full superband response). The comparison in each of the four wavebands is repeated under four solar illumination conditions: full daylight, clouds, dusk, and night.

Original languageEnglish (US)
Title of host publicationInfrared Imaging Systems
Subtitle of host publicationDesign, Analysis, Modeling, and Testing XXXV
EditorsDavid P. Haefner, Gerald C. Holst
PublisherSPIE
ISBN (Electronic)9781510674080
DOIs
StatePublished - 2024
EventInfrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXV 2024 - National Harbor, United States
Duration: Apr 23 2024Apr 25 2024

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13045
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceInfrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXV 2024
Country/TerritoryUnited States
CityNational Harbor
Period4/23/244/25/24

Keywords

  • emitted light
  • eSWIR
  • infrared
  • MWIR
  • radiometry
  • reflected light
  • superband
  • SWIR

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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