Abstract
A new design for a very lightweight, very high throughput reflectance sectrometer enabled by two new technologies being developed is presented. These new technologies include integral field unit optics to enable simultaneous imaging and spectroscopy at high spatial resolution with an infrared (IR) array, and silicon grisms to enable compact and high-resolution spectroscopy.
Original language | English (US) |
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Pages (from-to) | 45-56 |
Number of pages | 12 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 4859 |
DOIs | |
State | Published - 2002 |
Event | Instruments, Methods, and Missions for Astrobiology V - Waikoloa, HI, United States Duration: Aug 22 2002 → Aug 23 2002 |
Keywords
- 3-D imaging spectroscopy
- Image slicers
- Infrared
- Mars missions
- Silicon grisms
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering